use this promo code GCP50 to get 50% off. 1 ATTENDEE $2,000. Regular Price: $2000. Register for 1 a...
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Course "Applied Statistics, with Emphasis on Verification, Validation, and Risk Management, in R&D, Manufacturing, and QA/QC" has been pre-approved by RAPS as eligible for up to 12 credits towards a participant's RAC recertification upon full completion.
The 2-day seminar explains how to apply statistics to manage risks and verify/validate processes in R&D, QA/QC, and Manufacturing, with examples derived mainly from the medical device design/manufacturing industry. The flow of topics over the 2 days is as follows:
Why should you attend:
Almost all design and/or manufacturing companies evaluate product and processes either to manage risks, to validate processes, to establish product/process specifications, to QC to such specifications, and/or to monitor compliance to such specifications.
The various statistical methods used to support such activities can be intimidating. If used incorrectly or inappropriately, statistical methods can result in new products being launched that should have been kept in R&D; or, conversely, new products not being launched that, if analyzed correctly, would have met all requirements. In QC, mistakenly chosen sample sizes and inappropriate statistical methods may result in purchased product being rejected that should have passed, and vice-versa.
Areas Covered in the Session:
Day 1 Schedule
Vocabulary and Concepts
Confidence Intervals (attribute and variables data)
Normality Tests and Normality Transformations
Statistical Process Control (with focus on XbarR charts)
Confidence/Reliability calculations for Proportions
Confidence/Reliability calculations for Normally distributed data (K-tables)
Process Capability Indices calculations(Cp, Cpk, Pp, Ppk)
Day 2 Schedule
Confidence/Reliability calculations using Reliability Plotting (e.g., for non-normal data and/or censored studies)
Confidence/Reliability calculations for MTTF and MTBF (this typically applies only to electronic equipment)
Statistical Significance: t-Tests and related "power" estimations
Metrology (Gage R&R, Correlation, Linearity, Bias , and Uncertainty Budgets)
QC Sampling Plans (C=0 and Z1.4 attribute AQL plans, and alternatives to such plans), including OC curves, AQL vs. LQL/LTPD, AOQL, and calculation of acceptance rates.
Statistically valid statements for use in reports
Summary and Implementation Recommendations
John N. Zorich
Statistical Consultant & Trainer, Ohlone College & SV Polytechnic
John N. Zorich has spent 35 years in the medical device manufacturing industry; the first 20 years were as a "regular" employee in the areas of R&D, Manufacturing, QA/QC, and Regulatory; the last 15 years were as consultant in the areas of QA/QC and Statistics. His consulting clients in the area of statistics have included numerous start-ups as well as large corporations such as Boston Scientific, Novellus, and Siemens Medical. His experience as an instructor in statistics includes having given 3-day workshop/seminars for the past several years at Ohlone College (San Jose CA), 1-day training workshops in SPC for Silicon Valley Polytechnic Institute (San Jose CA) for several years, several 3-day courses for ASQ Biomedical, numerous seminars at ASQ meetings and conferences, and half-day seminars for numerous private clients. He creates and sells formally-validated statistical application spreadsheets that have been purchased by more than 75 companies, world-wide.
Location: Houston, TX Date: March 26th & 27th, 2019 and Time: 9:00 AM to 6:00 PM
Venue: Homewood Suites by Hilton Houston-Kingwood Parc, 23320 Hwy 59 N. Kingwood, TX 77339
Register for 1 attendees Price: $2,000.00
Register for 5 attendees Price: $10,000.00
Register for 10 attendees Price: $20,000.00
Until February 28, Early Bird Price: $2,000. From March 01 to March 24, Regular Price: $2,200.
use this promo code GCP50 to get 50% off.