The international conference on “Emerging Trends in Communication, Control, Signal Processing and Computing Applications” (C²SPCA 2013) is jointly organized by Departments of Electronics & Communication Engineering , Computer Applications (MCA), The Oxford College of Engineering, Bengaluru, India and The Oklahoma State University, USA. The conference C²SPCA 2013 promises to address current state of the technology and the outcome of the ongoing research in the area of advanced communication including Optical, Control, Signal Processing and Computing Applications. The conference would be held at The Oxford College of Engineering, Bangalore, India on 10th & 11thOctober, 2013.
The distinguishing characteristic of IEEE C²SPCA is the promotion of an intense dialogue between academia and industry to bridge the gap between academic research and industry initiatives. It will be fostered through keynotes and invited talks where academia is exposed to state-of-practice and results from industry trials, and interoperability experiments. The conference covers wide range of subjects from the field of Electronics, Control, Telecommunication, Computer Science & Engineering and which will spread from theory, design and applications in the areas. . The industry is benefited in turn by exposure to leading-edge research in the area as well as the opportunity to communicate to academic researchers which practical problems require further research.
C²SPCA 2013 would offer a forum to the academicians, researchers and students to interact with experts in emerging trends in various areas. We invite original and unpublished work from individuals active in the broad theme of the conference.The conference is technically sponsored by IEEE Photonic Society Bangalore chapter (India), IETE New Delhi, Institution of Engineers, India and Computer Society of India, Bangalore Chapter.The conference proceedings will be published by Conference Publication Services (CPS) with ISBN/ISSN number and will be sent for indexing and will be made available in IEEE Digital library Xplore.